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An absolute phase technique for 3D profile measurement using four-step structured light pattern
Xu, Jing1,2; Liu, Shaoli1; Wan, An1; Gao, Bingtuan3; Yi, Qiang1; Zhao, Danpu4; Luo, Ruikun1; Chen, Ken1
Source PublicationOPTICS AND LASERS IN ENGINEERING
2012-09-01
Volume50Issue:9Pages:1274-1280
SubtypeArticle
AbstractThe aim of this paper is to develop a four-step pattern encoding strategy through the combination of a triangle waveform, a step waveform, and two square waveforms. The proposed pattern encoding strategy makes the range of unique phase distribution up to 10 pi, which is 5 times as large as 2 pi of conventional four-step phase shifting encoding approach. Therefore, the proposed encoding strategy enables the structured light-based measurement system to measure complicated objects without ambiguity, which is the common limitation of the phase shifting algorithms. Furthermore, the proposed strategy is a pixel-level method, leading to a high-density 3D reconstruction. The decoding approach is a pixel independent computation, which can eliminate the error propagation and enhance the reliability. The phase errors between the phase shifting and the proposed encoding strategy are compared by the numerical simulation and they are very close. Experiments with different objects are carried out to validate the robustness and accuracy for the proposed encoding strategy. The results show that it is efficient for the 3D reconstruction of complicated objects. (C) 2012 Elsevier Ltd. All rights reserved.
KeywordStructured Light Relative Phase Absolute Phase
WOS HeadingsScience & Technology ; Physical Sciences
WOS KeywordSHAPE MEASUREMENT ; COMPENSATION ; PROFILOMETRY
Indexed BySCI
Language英语
WOS Research AreaOptics
WOS SubjectOptics
WOS IDWOS:000305773200012
Citation statistics
Cited Times:15[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ia.ac.cn/handle/173211/10744
Collection智能制造技术与系统研究中心_多维数据分析
Affiliation1.Tsinghua Univ, Dept Precis Instruments & Mechanol, Beijing 100084, Peoples R China
2.Tsinghua Univ, State Key Lab Tribol, Beijing 100084, Peoples R China
3.Southeast Univ, Sch Elect & Engn, Nanjing 210096, Peoples R China
4.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
Recommended Citation
GB/T 7714
Xu, Jing,Liu, Shaoli,Wan, An,et al. An absolute phase technique for 3D profile measurement using four-step structured light pattern[J]. OPTICS AND LASERS IN ENGINEERING,2012,50(9):1274-1280.
APA Xu, Jing.,Liu, Shaoli.,Wan, An.,Gao, Bingtuan.,Yi, Qiang.,...&Chen, Ken.(2012).An absolute phase technique for 3D profile measurement using four-step structured light pattern.OPTICS AND LASERS IN ENGINEERING,50(9),1274-1280.
MLA Xu, Jing,et al."An absolute phase technique for 3D profile measurement using four-step structured light pattern".OPTICS AND LASERS IN ENGINEERING 50.9(2012):1274-1280.
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