An absolute phase technique for 3D profile measurement using four-step structured light pattern
Xu, Jing1,2; Liu, Shaoli1; Wan, An1; Gao, Bingtuan3; Yi, Qiang1; Zhao, Danpu4; Luo, Ruikun1; Chen, Ken1
2012-09-01
发表期刊OPTICS AND LASERS IN ENGINEERING
卷号50期号:9页码:1274-1280
文章类型Article
摘要The aim of this paper is to develop a four-step pattern encoding strategy through the combination of a triangle waveform, a step waveform, and two square waveforms. The proposed pattern encoding strategy makes the range of unique phase distribution up to 10 pi, which is 5 times as large as 2 pi of conventional four-step phase shifting encoding approach. Therefore, the proposed encoding strategy enables the structured light-based measurement system to measure complicated objects without ambiguity, which is the common limitation of the phase shifting algorithms. Furthermore, the proposed strategy is a pixel-level method, leading to a high-density 3D reconstruction. The decoding approach is a pixel independent computation, which can eliminate the error propagation and enhance the reliability. The phase errors between the phase shifting and the proposed encoding strategy are compared by the numerical simulation and they are very close. Experiments with different objects are carried out to validate the robustness and accuracy for the proposed encoding strategy. The results show that it is efficient for the 3D reconstruction of complicated objects. (C) 2012 Elsevier Ltd. All rights reserved.
关键词Structured Light Relative Phase Absolute Phase
WOS标题词Science & Technology ; Physical Sciences
关键词[WOS]SHAPE MEASUREMENT ; COMPENSATION ; PROFILOMETRY
收录类别SCI
语种英语
WOS研究方向Optics
WOS类目Optics
WOS记录号WOS:000305773200012
引用统计
被引频次:15[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/10744
专题智能制造技术与系统研究中心_多维数据分析
作者单位1.Tsinghua Univ, Dept Precis Instruments & Mechanol, Beijing 100084, Peoples R China
2.Tsinghua Univ, State Key Lab Tribol, Beijing 100084, Peoples R China
3.Southeast Univ, Sch Elect & Engn, Nanjing 210096, Peoples R China
4.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714
Xu, Jing,Liu, Shaoli,Wan, An,et al. An absolute phase technique for 3D profile measurement using four-step structured light pattern[J]. OPTICS AND LASERS IN ENGINEERING,2012,50(9):1274-1280.
APA Xu, Jing.,Liu, Shaoli.,Wan, An.,Gao, Bingtuan.,Yi, Qiang.,...&Chen, Ken.(2012).An absolute phase technique for 3D profile measurement using four-step structured light pattern.OPTICS AND LASERS IN ENGINEERING,50(9),1274-1280.
MLA Xu, Jing,et al."An absolute phase technique for 3D profile measurement using four-step structured light pattern".OPTICS AND LASERS IN ENGINEERING 50.9(2012):1274-1280.
条目包含的文件
条目无相关文件。
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Xu, Jing]的文章
[Liu, Shaoli]的文章
[Wan, An]的文章
百度学术
百度学术中相似的文章
[Xu, Jing]的文章
[Liu, Shaoli]的文章
[Wan, An]的文章
必应学术
必应学术中相似的文章
[Xu, Jing]的文章
[Liu, Shaoli]的文章
[Wan, An]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。