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A Framework of RFID-Based Complex Event Processing System for Assembly Manufacturing
Mao N(毛娜); Tan J(谭杰)
2015-02
会议名称The 2nd International Conference on Applied Mechanics, Materials, and Manufacturing
会议录名称Materials Science, Applied Mechanics and Advanced Engineering Research
会议日期2014-12-9
会议地点Bangkok, Thailand
摘要
Owing to the dynamic and competitive business environment, manufacturing companies
take real-time monitoring and rapid decision making based on RFID applications, which brings huge volume of information and events generated in the defined manufacturing workflows. Complex Event Processing (CEP) is introduced to solve the problems mentioned above. CEP is applied to handle diverse and large amount of low-level multiple data and primitive events for the purpose of identifying meaningful event patterns. It is very important to integrate the CEP technology to the manufacturing workflows. In this paper, we provide a novel framework of RFID-based complex event processing system for assembly manufacturing applications like cars and high-speed trains. It bridges the hardware in workshops and enterprise applications. The Complex Event Management
System (CEMS), which is the kernel of the framework, can filter the irrelevant events and work with uncertain data. Furthermore, a concrete example is used to describe the framework and validate the feasibility in assembly monitoring of the car manufacturing.
收录类别EI
语种英语
文献类型会议论文
条目标识符http://ir.ia.ac.cn/handle/173211/11441
专题综合信息系统研究中心
作者单位Institute of Automation, Chinese Academy of Sciences
第一作者单位中国科学院自动化研究所
推荐引用方式
GB/T 7714
Mao N,Tan J. A Framework of RFID-Based Complex Event Processing System for Assembly Manufacturing[C],2015.
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