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Image tampering detection based on stationary distribution of markov chain
Wang, Wei; Dong, Jing; Tan, Tieniu
2010
Conference NameIEEE International Conference on Image Processing
Source PublicationProceedings of 2010 IEEE International Conference on Image Processing
Conference Date26-29 Sept. 2010
Conference PlaceHong Kong, China
AbstractIn this paper, we propose a passive image tampering detection method based on modeling edge information. We model the edge image of image chroma component as a finite-state Markov chain and extract low dimensional feature vector from its stationary distribution for tampering detection. The support vector machine (SVM) is utilized as classifier to evaluate the effectiveness of the proposed algorithm. The experimental results in a large scale of evaluation database illustrates that our proposed method is promising.
KeywordImage Forensics
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/12319
Collection智能感知与计算研究中心
Corresponding AuthorWang, Wei
Recommended Citation
GB/T 7714
Wang, Wei,Dong, Jing,Tan, Tieniu. Image tampering detection based on stationary distribution of markov chain[C],2010.
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