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Multi-class blind steganalysis based on image run-length analysis
Dong, Jing; Wang, Wei; Tan, Tieniu
2009
Conference NameInternational Workshop on Digital Watermarking
Source PublicationDigital Watermarking
Conference DateAugust 24-26, 2009
Conference PlaceGuildford, UK
AbstractIn this paper, we investigate our previously developed run-length based features for multi-class blind image steganalysis. We construct a Support Vector Machine classifier for multi-class recognition for both spatial and frequency domain based steganographic algorithms. We also study hierarchical and non-hierarchical multi-class schemes and compare their performance for steganalysis. Experimental results demonstrate that our approach is able to classify different stego images according to their embedding techniques based on appropriate supervised learning. It is also shown that the hierarchical scheme performs better in our experiments.
KeywordSteganalysis Multi-classes
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/12320
Collection智能感知与计算研究中心
09年以前成果
Corresponding AuthorDong, Jing
Recommended Citation
GB/T 7714
Dong, Jing,Wang, Wei,Tan, Tieniu. Multi-class blind steganalysis based on image run-length analysis[C],2009.
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