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Learning Stacked Image Descriptor for Face Recognition
Lei, Zhen; Yi, Dong; Li, Stan Z.
Source PublicationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY
2016-09-01
Volume26Issue:9Pages:1685-1696
SubtypeArticle
AbstractLearning-based face descriptors have constantly improved the face recognition performance. Compared with the hand-crafted features, learning-based features are considered to be able to exploit information with better discriminative ability for specific tasks. Motivated by the recent success of deep learning, in this paper, we extend the original shallow face descriptors to deep discriminant face features by introducing a stacked image descriptor (SID). With deep structure, more complex facial information can be extracted and the discriminant and compactness of feature representation can be improved. The SID is learned in a forward optimization way, which is computational efficient compared with deep learning. Extensive experiments on various face databases are conducted to show that SID is able to achieve high face recognition performance with compact face representation, compared with other state-of-the-art descriptors.
KeywordDeep Discriminant Face Representation Face Recognition Learning-based Descriptor Stacked Image Descriptor (Sid)
WOS HeadingsScience & Technology ; Technology
DOI10.1109/TCSVT.2015.2473415
WOS KeywordSPARSE REPRESENTATION ; VERIFICATION ; CLASSIFICATION ; DICTIONARY ; PATTERNS ; HISTOGRAM ; OCCLUSION ; IDENTITY ; MODEL
Indexed BySCI
Language英语
Funding OrganizationChinese National Natural Science Foundation(61572501 ; National Science and Technology Support Program(2013BAK02B01) ; Chinese Academy of Sciences(KGZD-EW-102-2) ; AuthenMetric Research and Development Funds ; 61375037 ; 61473291 ; 61572536)
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000384078400009
Citation statistics
Cited Times:16[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ia.ac.cn/handle/173211/12659
Collection模式识别国家重点实验室_生物识别与安全技术研究
AffiliationChinese Acad Sci, Inst Automat, Ctr Biometr & Secur Res, Natl Lab Pattern Recognit, Beijing 100190, Peoples R China
Recommended Citation
GB/T 7714
Lei, Zhen,Yi, Dong,Li, Stan Z.. Learning Stacked Image Descriptor for Face Recognition[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY,2016,26(9):1685-1696.
APA Lei, Zhen,Yi, Dong,&Li, Stan Z..(2016).Learning Stacked Image Descriptor for Face Recognition.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY,26(9),1685-1696.
MLA Lei, Zhen,et al."Learning Stacked Image Descriptor for Face Recognition".IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY 26.9(2016):1685-1696.
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