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Fusion of Global and Local Features for Face Verification
Yuchun Fang; Tieniu Tan; Yunhong Wang
2002
Conference NameIEEE International Conference on Pattern Recognition
Source PublicationProc. IEEE International Conference on Pattern Recognition
VolumeII
Pages382-385
Conference Date2002
Conference PlaceCanada
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/13945
Collection09年以前成果
Recommended Citation
GB/T 7714
Yuchun Fang,Tieniu Tan,Yunhong Wang. Fusion of Global and Local Features for Face Verification[C],2002:382-385.
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