CASIA OpenIR  > 模式识别国家重点实验室  > 模式分析与学习
Special issue "Advances in graph-based pattern recognition"
Liu, Cheng-Lin1; Luo, Bin2; Kropatsch, Walter3
Source PublicationPATTERN RECOGNITION LETTERS
2017-02-01
Volume87Pages:1-3
SubtypeEditorial Material
WOS HeadingsScience & Technology ; Technology
DOI10.1016/j.patrec.2016.10.008
Indexed BySCI
Language英语
WOS Research AreaComputer Science
WOS SubjectComputer Science, Artificial Intelligence
WOS IDWOS:000395616700001
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ia.ac.cn/handle/173211/14426
Collection模式识别国家重点实验室_模式分析与学习
Affiliation1.Chinese Acad Sci, Inst Automat, Beijing, Peoples R China
2.Anhui Univ, Hefei, Peoples R China
3.Vienna Univ Technol, Vienna, Austria
Recommended Citation
GB/T 7714
Liu, Cheng-Lin,Luo, Bin,Kropatsch, Walter. Special issue "Advances in graph-based pattern recognition"[J]. PATTERN RECOGNITION LETTERS,2017,87:1-3.
APA Liu, Cheng-Lin,Luo, Bin,&Kropatsch, Walter.(2017).Special issue "Advances in graph-based pattern recognition".PATTERN RECOGNITION LETTERS,87,1-3.
MLA Liu, Cheng-Lin,et al."Special issue "Advances in graph-based pattern recognition"".PATTERN RECOGNITION LETTERS 87(2017):1-3.
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