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A Novel Method to Evaluate the RFID System Reliability
Xie JW(谢家文); Wang ML(王敏丽); Tan J(谭杰); Xie JW(谢家文)
2017-02
Conference Name13th Global Congress on Manufacturing and Management, GCMM 2016
Volume174
Pages465–469
Conference Date2016.11.28-2016.11.30
Conference Place郑州
Project Number2014BAF07B04
AbstractThe RFID system application environment may be different,this have huge influence to the RFID system reliability.This paper presents a data-driven model to evaluate the reliability of RFID systems by analyzing the factors that affect RFID system raliability. We construct free-space and semi-closed metal environment two scenarios by using the proposed model to determine the reliable reference parameter range in these scenarios. The experimental results show that the proposed model can evaluate the reliability of RFID system easily and quickly in different application scenarios.
KeywordRfid System Data-driver Least Squares Reliability
DOI10.1016/j.proeng.2017.01.167
Indexed ByEI
Language英语
Citation statistics
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/14498
Collection综合信息系统研究中心
Corresponding AuthorXie JW(谢家文)
Affiliation中国科学院自动化研究所
Recommended Citation
GB/T 7714
Xie JW,Wang ML,Tan J,et al. A Novel Method to Evaluate the RFID System Reliability[C],2017:465–469.
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