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The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method
Yuan LX(袁伦喜); Zhang ZT(张正涛); Tao X(陶显)
2016-12
Conference NameWorld Congress on Intelligent Control and Automation
Conference Date2016.05.12-2016.05.15
Conference Place中国桂林
Abstract

Surface defects detection techniques are widely used and play very important roles in many fields, such as precision optical element used in high energy laser, wafer used in semiconductor, cover glass used in mobile phone, etc. This paper introduced the research progress in surface defect detection based on vision measurement, analyzed the significant and application of detecting the surface defect by using vision measurement, summarized the main work of this technology, and analyzed the key points and challenges in the application of these techniques. At last, this paper outlines the prospect and the direction for the surface defect detection based on vision measurement.

KeywordDefect Detect Vision Measurement
Indexed ByEI
Language英语
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/14558
Collection精密感知与控制研究中心_精密感知与控制
Affiliation中国科学院自动化研究所
First Author AffilicationInstitute of Automation, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
Yuan LX,Zhang ZT,Tao X. The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method[C],2016.
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