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Image Forensics Based on Planar Contact Constraints of 3D Objects
Peng, Bo1,2,3; Wang, Wei1; Dong, Jing1,4; Tan, Tieniu1
2018-02-01
发表期刊IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY
卷号13期号:2页码:377-392
文章类型Article
摘要Standing objects on planar surfaces are common to see in images, e.g., people on the ground. For most objects to stay stable on the plane, planar contact is a necessary requirement. However, 2D image splicing usually disregards this physical constraint of 3D world, leading to a potential artifact of object not attached to the plane. This paper is the first attempt to use the contact constraint of standing objects as a new clue for image forensics. Accordingly, we propose a novel approach to first reconstruct the 3D poses of standing objects and their supporting plane and then measure the contact conditions for splicing detection. To tackle the problem of unknown object shape for pose estimation, we effectively employ the prior knowledge of 3D morphable model to simultaneously estimate both shape and pose parameters by fitting to image observations. The 3D normal orientation of the supporting plane is estimated given its vanishing line. Dealing with uncertainty factors in estimations, we approximate a distribution of estimates using sampling strategies and then make the final decision. Particularly, we focused our method on the important scenario of human figure splicing detection, and comprehensive experiments on multiple data sets and typical images proved the encouraging effectiveness of the new forensic clue and the proposed approach.
关键词Image Forensics Splicing Detection Contact Constraint 3d Morphable Model
WOS标题词Science & Technology ; Technology
DOI10.1109/TIFS.2017.2752728
关键词[WOS]MORPHABLE MODEL ; FORGERIES
收录类别SCI
语种英语
项目资助者National Natural Science Foundation of China(61502496 ; National Key Research and Development Program of China(2016YFB1001003) ; U1536120 ; U1636201)
WOS研究方向Computer Science ; Engineering
WOS类目Computer Science, Theory & Methods ; Engineering, Electrical & Electronic
WOS记录号WOS:000417894200010
引用统计
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/15402
专题智能感知与计算研究中心
通讯作者Wang, Wei
作者单位1.Chinese Acad Sci, Inst Automat, Ctr Res Intelligent Percept & Comp, Beijing 100190, Peoples R China
2.State Key Lab Cryptol, Beijing 100878, Peoples R China
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
4.Chinese Acad Sci, Inst Informat Engn, State Key Lab Informat Secur, Beijing 100093, Peoples R China
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Peng, Bo,Wang, Wei,Dong, Jing,et al. Image Forensics Based on Planar Contact Constraints of 3D Objects[J]. IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY,2018,13(2):377-392.
APA Peng, Bo,Wang, Wei,Dong, Jing,&Tan, Tieniu.(2018).Image Forensics Based on Planar Contact Constraints of 3D Objects.IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY,13(2),377-392.
MLA Peng, Bo,et al."Image Forensics Based on Planar Contact Constraints of 3D Objects".IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY 13.2(2018):377-392.
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