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L2-Net: Deep Learning of Discriminative Patch Descriptor in Euclidean Space
Yurun Tian; Bin Fan; Fuchao Wu
2017
Conference NameIEEE International Conference on Computer Vision and Pattern Recognition
Conference Date2017
Conference PlaceUSA
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/19697
Collection模式识别国家重点实验室_先进数据分析与学习
AffiliationNational Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
Yurun Tian,Bin Fan,Fuchao Wu. L2-Net: Deep Learning of Discriminative Patch Descriptor in Euclidean Space[C],2017.
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