CASIA OpenIR  > 09年以前成果
THE RELIABILITY MODEL ON A 2-STAGE CIMS PRODUCTION LINE
MIN, T
Source PublicationMICROELECTRONICS AND RELIABILITY
1993-07-01
Volume33Issue:9Pages:1275-1280
SubtypeArticle
AbstractThis paper presents the reliability model on two stage CIMS production line, analyzes two numerical examples.
WOS HeadingsScience & Technology ; Technology ; Physical Sciences
Indexed BySCI
Language英语
WOS Research AreaEngineering ; Science & Technology - Other Topics ; Physics
WOS SubjectEngineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied
WOS IDWOS:A1993LK29200011
Citation statistics
Document Type期刊论文
Identifierhttp://ir.ia.ac.cn/handle/173211/21875
Collection09年以前成果
Recommended Citation
GB/T 7714
MIN, T. THE RELIABILITY MODEL ON A 2-STAGE CIMS PRODUCTION LINE[J]. MICROELECTRONICS AND RELIABILITY,1993,33(9):1275-1280.
APA MIN, T.(1993).THE RELIABILITY MODEL ON A 2-STAGE CIMS PRODUCTION LINE.MICROELECTRONICS AND RELIABILITY,33(9),1275-1280.
MLA MIN, T."THE RELIABILITY MODEL ON A 2-STAGE CIMS PRODUCTION LINE".MICROELECTRONICS AND RELIABILITY 33.9(1993):1275-1280.
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