CASIA OpenIR  > 09年以前成果
Uniform line parameterization
Hu, ZY; Ma, SD
Source PublicationPATTERN RECOGNITION LETTERS
1996-05-01
Volume17Issue:5Pages:503-507
SubtypeArticle
AbstractIn this paper, we introduce a special line parameterization, namely Uniform Line Parameterization, under which arbitrary noise in image space will be transformed by the Hough transform into uniform noise in parameter space. Such a line parameterization will greatly simplify the peak detection problem in parameter space, hence increase the reliability of the Hough transform when it is used for straight line detection.
KeywordHough Transform Line Parameterization Parameter Density Distribution
WOS HeadingsScience & Technology ; Technology
WOS KeywordHOUGH TRANSFORM
Indexed BySCI
Language英语
WOS Research AreaComputer Science
WOS SubjectComputer Science, Artificial Intelligence
WOS IDWOS:A1996UM01100009
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ia.ac.cn/handle/173211/21902
Collection09年以前成果
Recommended Citation
GB/T 7714
Hu, ZY,Ma, SD. Uniform line parameterization[J]. PATTERN RECOGNITION LETTERS,1996,17(5):503-507.
APA Hu, ZY,&Ma, SD.(1996).Uniform line parameterization.PATTERN RECOGNITION LETTERS,17(5),503-507.
MLA Hu, ZY,et al."Uniform line parameterization".PATTERN RECOGNITION LETTERS 17.5(1996):503-507.
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