A frequency mapping method for locating functional units inside ICs based on coaxial microscope

doi:10.1049/ell2.12373

CASIA OpenIR > 国家专用集成电路设计工程技术研究中心 > 微电子与系统技术

	A frequency mapping method for locating functional units inside ICs based on coaxial microscope
	Liu, Pengcheng 1,2; Han, Jianwei 1,2; Ma, Yingqi 1,2; Zhang, Feng3 ; Wu, Zongguo3 ; Zhu, Xiang 1,2; Cui, Yixin 1,2
发表期刊	ELECTRONICS LETTERS
ISSN	0013-5194
	2021-11-18
页码	3
通讯作者	Ma, Yingqi(myq@nssc.ac.cn)
摘要	Locating the physical position of functional units of the chip is a mandatory first step in various fields of applications, such as reverse engineering and hardware security. This paper presents a frequency mapping method based on the coaxial microscope to locate functional units inside ICs. A visible light camera is employed to focus the laser on the active region of the device under test based on the principle that the laser is strongly reflected at the metal in the active region. The target circuit modulates the laser at its operating frequency and the position of the target circuit could be accurately located by analyzing the frequency characteristics of the reflected laser. The results of transceiver chip localization indicate that the target circuit on the chip can be precisely located by this method without any additional processing of the chip. The coaxial microscopy design provides a good spot quality and signal-to-noise ratio, meanwhile, locating areas of the chip with operating currents down to 10(-10) A, compared with that of photonic emission analysis can only achieve the sensitivity of 5 x 10(-4) A. The sensitivity of the frequency mapping method is much better than that of Photonic Emission Analysis.
DOI	10.1049/ell2.12373
收录类别	SCI
语种	英语
资助项目	Foundation for Study Encouragement to Youth Innovation Promotion Association Member of Chinese Academy of Sciences[2018179] ; Beijing Municipal Science and Technology Commission[Z201100003520002]
项目资助者	Foundation for Study Encouragement to Youth Innovation Promotion Association Member of Chinese Academy of Sciences ; Beijing Municipal Science and Technology Commission
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000719862600001
出版者	WILEY
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.ia.ac.cn/handle/173211/46489
专题	国家专用集成电路设计工程技术研究中心_微电子与系统技术国家专用集成电路设计工程技术研究中心
通讯作者	Ma, Yingqi
作者单位	1.Chinese Acad Sci, Natl Space Sci Ctr, Space Environm Effects Lab, Beijing, Peoples R China 2.Univ Chinese Acad Sci, Sch Astron & Space Sci, Beijing, Peoples R China 3.Chinese Acad Sci, Natl Engn & Technol Res Ctr ASIC Design, Inst Automat, Beijing, Peoples R China
推荐引用方式 GB/T 7714	Liu, Pengcheng,Han, Jianwei,Ma, Yingqi,et al. A frequency mapping method for locating functional units inside ICs based on coaxial microscope[J]. ELECTRONICS LETTERS,2021:3.
APA	Liu, Pengcheng.,Han, Jianwei.,Ma, Yingqi.,Zhang, Feng.,Wu, Zongguo.,...&Cui, Yixin.(2021).A frequency mapping method for locating functional units inside ICs based on coaxial microscope.ELECTRONICS LETTERS,3.
MLA	Liu, Pengcheng,et al."A frequency mapping method for locating functional units inside ICs based on coaxial microscope".ELECTRONICS LETTERS (2021):3.