Abnormal area identification of corn ear based on semi-supervised learning
Wei, Jian1; Ma, Qin1,2; Wang, Weitao1; Guo, Hao3; Liu, Zhe3; Zhang, Jiajing4,5
发表期刊IET IMAGE PROCESSING
ISSN1751-9659
2022-04-14
页码10
通讯作者Ma, Qin(sockline@163.com)
摘要Screening corn ear is the key link in the breeding process of new varieties. But manual testing is difficult to measure the proportion of abnormal area. Meanwhile, the abnormal areas are mainly caused by mildew, moth and mechanical collision. A new refined semantic segmentation model was proposed based on the semi-supervised learning method of generating antagonistic networks (GAN). Besides k-means algorithm was used to remove a large amount of background information for data preprocessing. By using feature fusion and weighted loss function the model performance was improved. The introduction of transfer learning accelerated model convergence. Through the high-throughput corn ear collection system, 1448 ear images (including abnormal conditions such as mildew, moth and mechanical damage) were collected and labelled. The proposed method was tested on real corn ear images with an accuracy of 0.950, mean precision of 0.933, mean IoU of 0.884, and FwIoU of 0.908. Experimental results show that the proposed method has better performance than general networks.
DOI10.1049/ipr2.12492
收录类别SCI
语种英语
资助项目[2021ZD0113701]
WOS研究方向Computer Science ; Engineering ; Imaging Science & Photographic Technology
WOS类目Computer Science, Artificial Intelligence ; Engineering, Electrical & Electronic ; Imaging Science & Photographic Technology
WOS记录号WOS:000782384000001
出版者WILEY
引用统计
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/48281
专题多模态人工智能系统全国重点实验室_互联网大数据与信息安全
通讯作者Ma, Qin
作者单位1.China Agr Univ, Coll Informat & Elect Engn, Beijing 100083, Peoples R China
2.Minist Agr & Rural Affairs, Key Lab Agr Machinery Monitoring & Big Data Appli, Beijing, Peoples R China
3.China Agr Univ, Coll Land Sci & Technol, Beijing, Peoples R China
4.Chinese Acad Sci, Inst Automat, State Key Lab Management & Control Complex Syst, Beijing, Peoples R China
5.Univ Chinese Acad Sci, Sch Artificial Intelligence, Beijing, Peoples R China
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GB/T 7714
Wei, Jian,Ma, Qin,Wang, Weitao,et al. Abnormal area identification of corn ear based on semi-supervised learning[J]. IET IMAGE PROCESSING,2022:10.
APA Wei, Jian,Ma, Qin,Wang, Weitao,Guo, Hao,Liu, Zhe,&Zhang, Jiajing.(2022).Abnormal area identification of corn ear based on semi-supervised learning.IET IMAGE PROCESSING,10.
MLA Wei, Jian,et al."Abnormal area identification of corn ear based on semi-supervised learning".IET IMAGE PROCESSING (2022):10.
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