CASIA OpenIR  > 综合信息系统研究中心
An approach to test security of EPCglobal class 1 generation 2 RFID system
Zhao, Hongsheng; Tan, Jie; Zhu, Zhiyuan
2010
Conference Name2010 IEEE International Conference on RFID-Technology and Applications, RFID-TA 2010
Source PublicationIEEE International Conference on RFID-Technology and Applications (RFID-TA)
Pages77-80
Conference Date2010
Indexed ByEI
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/5517
Collection综合信息系统研究中心
Recommended Citation
GB/T 7714
Zhao, Hongsheng,Tan, Jie,Zhu, Zhiyuan. An approach to test security of EPCglobal class 1 generation 2 RFID system[C],2010:77-80.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Zhao, Hongsheng]'s Articles
[Tan, Jie]'s Articles
[Zhu, Zhiyuan]'s Articles
Baidu academic
Similar articles in Baidu academic
[Zhao, Hongsheng]'s Articles
[Tan, Jie]'s Articles
[Zhu, Zhiyuan]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Zhao, Hongsheng]'s Articles
[Tan, Jie]'s Articles
[Zhu, Zhiyuan]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.