Knowledge Commons of Institute of Automation,CAS
Novel methods for locating and matching IC cells based on standard cell libraries | |
Liu, Can1,2; Wang, Kaige3; Li, Qing1; Zhao, Fazhan1; Zhao, Kun4; Ma, Hongtu4 | |
发表期刊 | MICROELECTRONIC ENGINEERING |
ISSN | 0167-9317 |
2024 | |
卷号 | 283页码:12 |
通讯作者 | Liu, Can(canliu@whu.edu.cn) ; Li, Qing(liqing@ime.ac.cn) |
摘要 | In the domain of hardware assurance, reverse engineering (RE) is essential for ensuring the security and reliability of integrated circuits (ICs). A potential approach in the crucial step of netlist extraction involves matching patterns in IC images to standard cell libraries. However, the morphological variations in images of cells and intra-cell similarities present significant challenges to effective matching. This paper introduces a new matching dataset of cells in Scanning Electron Microscopy (SEM) images and standard cells, including 579 SEM cells, two standard cell libraries, and 508 types of standard cells. Furthermore, we propose a novel matching method reliant on standard cell libraries. This method generates templates using the feature information of standard cells and conducts matching by comparing the similarity between the feature vector sets of an SEM cell and the templates, achieving a 100% accuracy rate on the matching dataset. Given that the matching method relies on accurate cell localization, we propose two methods of merging bounding boxes. These methods can convert the object detector's detection results on patches into localization results on the entire image, achieving 99.48% accuracy and 99.31% recall on the image of the matching dataset. Finally, We consolidate these methods into a comprehensive workflow for automating the extraction of cell information in large-scale IC images. |
关键词 | Reverse engineering Integrated circuits Scanning electron microscopy Image processing Hardware security |
DOI | 10.1016/j.mee.2023.112107 |
关键词[WOS] | HARDWARE ; ALGORITHM ; NOISE |
收录类别 | SCI |
语种 | 英语 |
资助项目 | National Key Research and Development Program of China[2021YFB3100904] |
项目资助者 | National Key Research and Development Program of China |
WOS研究方向 | Engineering ; Science & Technology - Other Topics ; Optics ; Physics |
WOS类目 | Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Optics ; Physics, Applied |
WOS记录号 | WOS:001104106700001 |
出版者 | ELSEVIER |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ia.ac.cn/handle/173211/55208 |
专题 | 脑图谱与类脑智能实验室 |
通讯作者 | Liu, Can; Li, Qing |
作者单位 | 1.Chinese Acad Sci IMECAS, Inst Microelect, Beijing, Peoples R China 2.Univ Chinese Acad Sci, Sch Integrated Circuits, Beijing 100020, Peoples R China 3.China Acad Aerosp Sci & Innovat, Beijing 100048, Peoples R China 4.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China |
推荐引用方式 GB/T 7714 | Liu, Can,Wang, Kaige,Li, Qing,et al. Novel methods for locating and matching IC cells based on standard cell libraries[J]. MICROELECTRONIC ENGINEERING,2024,283:12. |
APA | Liu, Can,Wang, Kaige,Li, Qing,Zhao, Fazhan,Zhao, Kun,&Ma, Hongtu.(2024).Novel methods for locating and matching IC cells based on standard cell libraries.MICROELECTRONIC ENGINEERING,283,12. |
MLA | Liu, Can,et al."Novel methods for locating and matching IC cells based on standard cell libraries".MICROELECTRONIC ENGINEERING 283(2024):12. |
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