Investigation on vibration induced fretting in degraded contact interface | |
Qingya Li![]() | |
发表期刊 | MICROELECTRONICS RELIABILITY
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ISSN | 0026-2714 |
2022 | |
卷号 | 139页码:114974 |
摘要 | Connectors are widely used in electrical systems and are subject to a variety of degradation mechanisms that can negatively impact electrical performance. One major cause of degradation is vibration induced fretting. While there has been considerable work on the effects of general connector degradation and defects on high frequency characteristics, there has been little focused work that specifically considers effects of vibration induced fretting in actual coaxial connector systems. Accordingly, in the present work, a detailed study of an example coaxial connector with a degraded contact surface was conducted, and the effects on vibration induced fretting are characterized using the high frequency results considering the parameters of resistance, capacitance, and inductance. The contact degradation process caused by the fretting was investigated using theoretical analysis, software simulation, and experimental tests. Simulations were performed to evaluate the high frequency behavior within a frequency range of 0.1 MHz to 1.0 GHz. An experimental investigation was conducted to investigate the effect of degraded contact surfaces on high frequency characteristics and provide validation for the model results. The simulation results were consistent with the measured results for both fresh and degraded connectors. Compared to the fresh condition, the S parameters and S 21 11 parameters of the first and second degradation levels increased and decreased, respectively. These results indicate that contact damage due to fretting in the sample system generally results in the deteri oration of high frequency properties and signal integrity. |
关键词 | Coaxial connector Contact surface failure Vibration induced fretting High frequency characteristic |
学科门类 | 工学 ; 工学::电子科学与技术(可授工学、理学学位) |
收录类别 | SCI |
语种 | 英语 |
出版者 | MICROELECTRONICS RELIABILITY |
七大方向——子方向分类 | 其他 |
国重实验室规划方向分类 | 其他 |
是否有论文关联数据集需要存交 | 否 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ia.ac.cn/handle/173211/57081 |
专题 | 国家专用集成电路设计工程技术研究中心_信号处理及脑机接口芯片 |
推荐引用方式 GB/T 7714 | Qingya Li,Jinchun Gao,George T. Flowers,et al. Investigation on vibration induced fretting in degraded contact interface[J]. MICROELECTRONICS RELIABILITY,2022,139:114974. |
APA | Qingya Li,Jinchun Gao,George T. Flowers,Wei Yi,Robert L. Jackson,&Michael Hamilton.(2022).Investigation on vibration induced fretting in degraded contact interface.MICROELECTRONICS RELIABILITY,139,114974. |
MLA | Qingya Li,et al."Investigation on vibration induced fretting in degraded contact interface".MICROELECTRONICS RELIABILITY 139(2022):114974. |
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