CASIA OpenIR  > 中国科学院分子影像重点实验室
X射线计算机断层成像系统的几何校正方法
田捷; 朱守平; 杨鑫; 闫国瑞
2009-06-10
Date Available2010-06-23
CountryCN
Subtype发明
Abstract本发明是X射线计算机断层成像系统的几何校正方法,尤其适合于圆轨道的锥束和扇束计算机断层成像系统的几何参数校正,利用线模体X射线计算机断层成像三维重建数据中包含的计算机断层成像系统的X射线探测器偏移信息,精确估计X射线探测器的水平偏移量,并用获得的水平偏移量进行X射线计算机断层成像系统的几何校正,从而提高X射线计算机断层成像系统的空间分辨率,减少图像伪影。
Copyright Date2011-10-12
Patent NumberCN200910087131.7
Status授权
Document Type专利
Identifierhttp://ir.ia.ac.cn/handle/173211/8377
Collection中国科学院分子影像重点实验室
Affiliation中国科学院自动化研究所
Recommended Citation
GB/T 7714
田捷,朱守平,杨鑫,等. X射线计算机断层成像系统的几何校正方法. CN200910087131.7[P]. 2009-06-10.
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