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RFID标签响应频率基准测试系统及方法
刘禹; 朱智源; 李秀萍
2009-11-11
Date Available2010-07-21
CountryCN
Subtype发明
Abstract本发明提供一种RFID标签响应频率基准测试系统及方法,该系统由标准测试环境、信号源发射天线、接收天线、待测RFID标签、信号源天线支架、接收天线支架、标签支架、信号源、频谱分析仪、控制计算机组成,该方法是在保持输入能量相同的情况下,通过分析一款RFID标签产品在不同测试频带内的响应特性,得到待测试RFID标签能够正常响应读写器信号的频域范围。通过模拟读写器读RFID标签信号实现对RFID频率范围进行测试,可以为使用者提供一种简单、明确、有效的RFID自动化测试工具和基准测试方法。
Patent NumberCN200910237841.3
Status授权
Document Type专利
Identifierhttp://ir.ia.ac.cn/handle/173211/8425
Collection综合信息系统研究中心
Affiliation中国科学院自动化研究所
First Author AffilicationInstitute of Automation, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
刘禹,朱智源,李秀萍. RFID标签响应频率基准测试系统及方法. CN200910237841.3[P]. 2009-11-11.
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