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采用低维阵列探测的契伦科夫荧光断层成像系统与方法
田捷; 秦承虎; 钟江宏; 杨鑫
2011-07-26
Date Available2012-02-01
CountryCN
Subtype发明
Abstract本发明公开了一种采用低维阵列探测的契伦科夫荧光断层成像系统及方法,该系统包括:光学探测装置,用于围绕物理成像对象的中心轴线,从四象限各采集一幅物理成像对象的平面光学图像,并存储于数据处理装置;结构成像装置,用于采集物理成像对象的整体计算机断层成像图像,并存储于数据处理装置;以及数据处理装置,用于对存储的四幅平面光学图像和整体CT原始图像进行融合重建,形成CLT图像。本发明使用低维信号探测单元阵列,结合几何尺度变换和信息传递近似模型,实现物理成像对象内部超高维未知分布矢量的三维图像,缩短了探测器扫描与成像时间,降低了生理与环境因素造成的图像质量退化风险,为严重病态核医学反演成像提供一种快速准确方法。
Copyright Date2014-02-05
Patent NumberCN201110209916.4
Status授权
Document Type专利
Identifierhttp://ir.ia.ac.cn/handle/173211/8574
Collection中国科学院分子影像重点实验室
Affiliation中国科学院自动化研究所
First Author AffilicationInstitute of Automation, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
田捷,秦承虎,钟江宏,等. 采用低维阵列探测的契伦科夫荧光断层成像系统与方法. CN201110209916.4[P]. 2011-07-26.
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