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Leakage current estimation of CMOS circuit with stack effect
Xu, YJ; Luo, ZY; Li, XW; Li, LJ; Hong, XL
2004-09-01
发表期刊JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
卷号19期号:5页码:708-717
文章类型Article
摘要Leakage current of CMOS circuit increases dramatically with the technology scaling down and has become a critical issue of high performance system. Subthreshold, gate and reverse biased junction band-to-band tunneling (BTBT) leakages are considered three main determinants of total leakage current. Up to now, how to accurately estimate leakage current of large-scale circuits within endurable time remains unsolved, even though accurate leakage models have been widely discussed. In this paper, the authors first dip into the stack effect of CMOS technology and propose a new simple gate-level leakage current model. Then, a table-lookup based total leakage current simulator is built up according to the model. To validate the simulator, accurate leakage current is simulated at circuit level using popular simulator HSPICE for comparison. Some further studies such as maximum leakage current estimation, minimum leakage current generation and a high-level average leakage current macromodel are introduced in detail. Experiments on ISCAS85 and ISCAS89 benchmarks demonstrate that the two proposed leakage current estimation methods are very accurate and efficient.
关键词Computer-aided Design Leakage Current Estimation Stack Effect Macromodeling Propagation Of Signal Probability
WOS标题词Science & Technology ; Technology
关键词[WOS]DEEP-SUBMICROMETER ; ALGORITHMS ; REDUCTION ; POWER
收录类别SCI
语种英语
WOS研究方向Computer Science
WOS类目Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
WOS记录号WOS:000224137200017
引用统计
被引频次:3[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/9968
专题09年以前成果
作者单位1.Chinese Acad Sci, Inst Comp Technol, Beijing 100080, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
3.Tsing Hua Univ, Dept Comp Sci & Technol, Beijing 100084, Peoples R China
4.Chinese Acad Sci, Inst Automat, Natl ASIC Design Engn Ctr, Beijing 100080, Peoples R China
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Xu, YJ,Luo, ZY,Li, XW,et al. Leakage current estimation of CMOS circuit with stack effect[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2004,19(5):708-717.
APA Xu, YJ,Luo, ZY,Li, XW,Li, LJ,&Hong, XL.(2004).Leakage current estimation of CMOS circuit with stack effect.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,19(5),708-717.
MLA Xu, YJ,et al."Leakage current estimation of CMOS circuit with stack effect".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 19.5(2004):708-717.
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