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当前检索式 ((ALL：surface defect detection))
限定条件 ((出处：IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT) AND (语种：英语))
共15条，第1-15条
National Natural Sci 7 National Key Researc 5 Beijing Municipal Na 2
61227804 1 61303177 1 61421004) 1
Beijing Municipal Na 1 CIE-Tencent Robotics 1 Chinese Academy of S 1
National Natural Sci 1 Science Challenge Pr 1 Strategic Priority R 1
Youth Innovation Pro 1 Youth Innovation Pro 1 special fund of Jian 1