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Surface Defects Detection Based on Adaptive Multiscale Image Collection and Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 卷号: 68, 期号: 12, 页码: 4787-4797
作者:  Sun, Jia;  Wang, Peng;  Luo, Yong-Kang;  Li, Wanyi
浏览  |  Adobe PDF(4530Kb)  |  收藏  |  浏览/下载:244/78  |  提交时间:2020/03/30
Inspection  Surface treatment  Training  Metals  Task analysis  Instruments  Visualization  Adaptive multiscale image collection (AMIC)  convolutional neural networks (CNNs)  image classification  surface inspection  
Surface flaws detection algorithms for large aperture optical element 会议论文
, 北京, 2015.08.22-2015.08.24
作者:  Zhang Zheng-Tao;  Tao Xian;  Xu De;  Tao X(陶显)
浏览  |  Adobe PDF(1794Kb)  |  收藏  |  浏览/下载:272/63  |  提交时间:2018/01/04
The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method 会议论文
, 中国桂林, 2016.05.12-2016.05.15
作者:  Yuan LX(袁伦喜);  Zhang ZT(张正涛);  Tao X(陶显)
浏览  |  Adobe PDF(657Kb)  |  收藏  |  浏览/下载:706/289  |  提交时间:2017/05/10
Defect Detect  Vision Measurement  
Weak scratch detection and defect classification methods for a large-aperture optical element 期刊论文
OPTICS COMMUNICATIONS, 2017, 卷号: 387, 期号: 0, 页码: 390-400
作者:  Tao, Xian;  Xu, De;  Zhang, Zheng-Tao;  Zhang, Feng;  Liu, Xi-Long;  Zhang, Da-Peng
浏览  |  Adobe PDF(1478Kb)  |  收藏  |  浏览/下载:974/462  |  提交时间:2017/02/14
Optical Inspection  Weak Scratches  Surface Defects Classification  Large-aperture Optical Element  
基于显微视觉的表面瑕疵检测与振动测量研究 学位论文
, 北京: 中国科学院研究生院, 2016
作者:  陶显
Adobe PDF(10296Kb)  |  收藏  |  浏览/下载:377/7  |  提交时间:2016/06/20
大口径光学元件  表面瑕疵检测  振动测量  显微视觉  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载:508/138  |  提交时间:2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning