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X射线计算机断层成像系统的几何校正方法 专利
专利类型: 发明, 专利号: CN200910087131.7, 申请日期: 2009-06-10, 公开日期: 2010-06-23
Inventors:  田捷;  朱守平;  杨鑫;  闫国瑞
Adobe PDF(928Kb)  |  Favorite  |  View/Download:89/14  |  Submit date:2015/09/22