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中国科学院自动化研究所机构知识库
Knowledge Commons of Institute of Automation，CAS
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Chinese Ac... [1]
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Yang Xin [1]
Tian Jie [1]
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Patent [1]
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2011 [1]
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采用低维阵列探测的契伦科夫荧光断层成像系统与方法
专利
专利类型: 发明, 专利号: CN201110209916.4, 申请日期: 2011-07-26, 公开日期: 2012-02-01
Inventors:
田捷
;
秦承虎
;
钟江宏
;
杨鑫
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Submit date：2015/09/22
