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Quality metrology of carbon nanotube thin films and its application for carbon nanotube-based electronics 期刊论文
NANO RESEARCH, 2020, 页码: 7
作者:  Zhao, Jie;  Shen, Lijun;  Liu, Fang;  Zhao, Pan;  Huang, Qi;  Han, Hua;  Peng, Lianmao;  Liang, Xuelei
收藏  |  浏览/下载：213/0  |  提交时间：2020/06/22
carbon nanotube  thin films  quality metrology  local anisotropy  transistors  
Progress in a novel architecture for high performance processing 期刊论文
JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 卷号: 57, 期号: 4
作者:  Zhang, Zhiwei;  Liu, Meng;  Liu, Zijun;  Du, Xueliang;  Xie, Shaolin;  Ma, Hong;  Ding, Guangxin;  Ren, Weili;  Zhou, Fabiao;  Sun, Wenqin;  Wang, Huijuan;  Wang, Donglin
收藏  |  浏览/下载：281/0  |  提交时间：2018/10/10
A Closed-Loop Controlled Nanomanipulation System for Probing Nanostructures Inside Scanning Electron Microscopes 期刊论文
IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2016, 卷号: 21, 期号: 3, 页码: 1233-1241
作者:  Zhou, Chao;  Gong, Zheng;  Chen, Brandon K.;  Cao, Zhiqiang;  Yu, Junzhi;  Ru, Changhai;  Tan, Min;  Xie, Shaorong;  Sun, Yu;  Yu, Sun
Adobe PDF(3510Kb)  |  收藏  |  浏览/下载：502/174  |  提交时间：2016/10/19
Nanopositioning  Nanomanipulation  Probing Nanostructures  
Collection of charge in NMOS from single event effect 期刊论文
IEICE ELECTRONICS EXPRESS, 2016, 卷号: 13, 期号: 8, 页码: 1-8
作者:  Wang, Jingqiu;  Lin, Fujiang;  Wang, Donglin;  Song, Wenna;  Liu, Li;  Song, Qiwei;  Chen, Liang
Adobe PDF(2518Kb)  |  收藏  |  浏览/下载：275/59  |  提交时间：2016/09/30
Single Event Effect  Ultra Deep Sub-micron  Double Exponential Transient Current Model  Multi-dimensional  
Including the Effects of Process-Related Variability on Radiation Response in Advanced Foundry Process Design Kits 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 卷号: 57, 期号: 6, 页码: 3570-3574
作者:  Li, Yanfeng;  Rezzak, Nadia;  Zhang, En Xia;  Schrimpf, Ronald D.;  Fleetwood, Daniel M.;  Wang, Jingqiu;  Wang, Donglin;  Wu, Yanjun;  Cai, Shuang
浏览  |  Adobe PDF(415Kb)  |  收藏  |  浏览/下载：297/81  |  提交时间：2015/11/08
Mismatch  Process Design Kit  Process Variability  Radiation Effects  Stress  Tid