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Path Delay Test generation Toward Activation of worst Case Coupling Effects 期刊论文
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982
Authors:  minjin, zhang;  Huawei, Li;  Xiaowei,Li
View  |  Adobe PDF(345Kb)  |  Favorite  |  View/Download:23/4  |  Submit date:2017/09/19
Crosstalk-induced Delay  Delay Testing  Path Delay Fault  Signal Integrity  Test Generation  Timing Analysis