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中国科学院自动化研究所机构知识库
Knowledge Commons of Institute of Automation，CAS
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Chinese Ac... [1]
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Tao Xian [1]
Ma WenZhi [1]
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2021 [1]
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Date Issued：2021
Author：马文治
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Indexed By：SCIE
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Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network
期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
Authors:
Tao X(陶显)
;
Ma WZ(马文治)
;
Lu ZF(逯正峰)
;
Hou ZX(侯占新)
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Submit date：2022/03/03
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