CASIA OpenIR

Browse/Search Results:  1-1 of 1 Help

Filters    
Selected(0)Clear Items/Page:    Sort:
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
Authors:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  Favorite  |  View/Download:269/63  |  Submit date:2022/03/03
缺陷检测