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Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
收藏  |  浏览/下载：200/0  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：299/67  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
DeepScan: Exploiting Deep Learning Malicious Account Detection in Location-Based Social Networks 期刊论文
IEEE COMMUNICATIONS MAGAZINE, 2018, 卷号: 56, 期号: 11, 页码: 21-27
作者:  Gong, Qingyuan;  Chen, Yang;  He, Xinlei;  Zhuang, Zhou;  Wang, Tianyi;  Huang, Hong;  Wang, Xin;  Fu, Xiaoming
收藏  |  浏览/下载：259/0  |  提交时间：2019/01/08