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Collection of charge in NMOS from single event effect 期刊论文
IEICE ELECTRONICS EXPRESS, 2016, 卷号: 13, 期号: 8, 页码: 1-8
Authors:  Wang, Jingqiu;  Lin, Fujiang;  Wang, Donglin;  Song, Wenna;  Liu, Li;  Song, Qiwei;  Chen, Liang
Adobe PDF(2518Kb)  |  Favorite  |  View/Download:87/13  |  Submit date:2016/09/30
Single Event Effect  Ultra Deep Sub-micron  Double Exponential Transient Current Model  Multi-dimensional  
Including the Effects of Process-Related Variability on Radiation Response in Advanced Foundry Process Design Kits 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 卷号: 57, 期号: 6, 页码: 3570-3574
Authors:  Li, Yanfeng;  Rezzak, Nadia;  Zhang, En Xia;  Schrimpf, Ronald D.;  Fleetwood, Daniel M.;  Wang, Jingqiu;  Wang, Donglin;  Wu, Yanjun;  Cai, Shuang
View  |  Adobe PDF(415Kb)  |  Favorite  |  View/Download:78/12  |  Submit date:2015/11/08
Mismatch  Process Design Kit  Process Variability  Radiation Effects  Stress  Tid