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Surface Defect Detection on Optical Devices Based on Microscopic Dark-Field Scattering Imaging 期刊论文
STROJNISKI VESTNIK-JOURNAL OF MECHANICAL ENGINEERING, 2015, 卷号: 61, 期号: 1, 页码: 24-32
Authors:  Yin, Yingjie;  Xu, De;  Zhang, Zhengtao;  Bai, Mingran;  Zhang, Feng;  Tao, Xian;  Wang, Xingang
View  |  Adobe PDF(2375Kb)  |  Favorite  |  View/Download:298/50  |  Submit date:2015/09/18
Scale Invariance Feature Transform  Linear Discriminant Function  Cluster Algorithm  Image Segmentation  Image Mosaic  Dark-field Imaging  Optical Devices