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A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
Authors:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
View  |  Adobe PDF(591Kb)  |  Favorite  |  View/Download:145/21  |  Submit date:2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning