Sensitive Quality-Relevant Fault Monitoring using Enhanced Sparse Projection to Latent Structures
Bai, Xiwei1,2; Wang, Xuelei1; Tan, Jie1; Qin, Wei3; Zhang, Tianren4; Sun, Wei4
2018
会议名称2018 13th World Congress on Intelligent Control and Automation
会议日期July 4-8, 2018
会议地点Changsha, China
摘要

As one of the most common and effective quality-relevant fault monitoring techniques, projection to latent structures(PLS) and its improved algorithms have been wildly used in many industries to provide assurance for high-quality products. In this paper, a new enhanced sparse projection to latent structures(ESPLS) algorithm is proposed to achieve quality-relevant fault monitoring with better sensitivity. The algorithm implements sparse orthogonal decomposition on input process variable space. Two indices based on quality-relevant subspace and quality-irrelevant subspace with major variation are developed for fault detection and analysis. Experiments on Tennessee Eastman Process (TEP) chemical benchmark reveal its outstanding performance in fault detection and superior accuracy in differentiating the quality-relevant and irrelevant impact of the given fault.

收录类别EI
文献类型会议论文
条目标识符http://ir.ia.ac.cn/handle/173211/39264
专题中科院工业视觉智能装备工程实验室_工业智能技术与系统
通讯作者Tan, Jie
作者单位1.Institute of Automation, Chinese Academy of Sciences
2.University of Chinese Academy of Sciences
3.Sinopec Zhongyuan Oilfield Puguang company gas production plant
4.Zhejiang Tianneng Energy Technology Co., Ltd.
第一作者单位中国科学院自动化研究所
通讯作者单位中国科学院自动化研究所
推荐引用方式
GB/T 7714
Bai, Xiwei,Wang, Xuelei,Tan, Jie,et al. Sensitive Quality-Relevant Fault Monitoring using Enhanced Sparse Projection to Latent Structures[C],2018.
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