Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability

doi:10.1007/s11633-018-1129-8

CASIA OpenIR > 学术期刊 > Machine Intelligence Research

	Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability
	Chang-Jun Li; Zong-Shi Xie; Xin-Ran Peng; Bo Li
发表期刊	International Journal of Automation and Computing
ISSN	1476-8186
	2019
卷号	16 期号:2 页码:186-198
摘要	“Factory physics principles” provided a method to evaluate the performance of a simple production line, whose fundamental parameters are known or given. However, it is difficult to obtain the exact and reasonable parameters in actual manufacturing environment, especially for the complex chipset assembly & test production line (CATPL). Besides, research in this field tends to focus on evaluation and improvement of CATPL without considering performance interval and status with variability level. A developed internal benchmark method is proposed, which established three-parameter method based on the Little′s law. It integrates the variability factors, such as processing time, random failure time, and random repair time, to meet performance evaluation and improvement. A case study in a chipset assembly and test factory for the performance of CATPL is implemented. The results demonstrate the potential of the proposed method to meet performance evaluation and emphasise its relevance for practical applications.
关键词	Performance evaluation and improvement chipset assembly & test production line (CATPL) parameters Little′s law variability.
DOI	10.1007/s11633-018-1129-8
引用统计
文献类型	期刊论文
条目标识符	http://ir.ia.ac.cn/handle/173211/42330
专题	学术期刊_Machine Intelligence Research
作者单位	School of Aeronautics and Astronautics, University of Electronic Science and Technology of China, Chengdu 611731, China
推荐引用方式 GB/T 7714	Chang-Jun Li,Zong-Shi Xie,Xin-Ran Peng,et al. Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability[J]. International Journal of Automation and Computing,2019,16(2):186-198.
APA	Chang-Jun Li,Zong-Shi Xie,Xin-Ran Peng,&Bo Li.(2019).Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability.International Journal of Automation and Computing,16(2),186-198.
MLA	Chang-Jun Li,et al."Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability".International Journal of Automation and Computing 16.2(2019):186-198.

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