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Planar pattern for automatic camera calibration
Zhang, BW; Li, YF; Wu, FC
Source PublicationOPTICAL ENGINEERING
2003-06-01
Volume42Issue:6Pages:1542-1549
SubtypeArticle
AbstractWe present a method for automatic camera calibration that requires only that a planar pattern be visible by the camera from a few (at least three) different views. A major issue is how to obtain the projection of an absolute point using the planar pattern. In the calibration, we can move either the camera or the planar pattern and no knowledge about the motion is required. We consider and resolve both linear and nonlinear parameters. In testing the proposed methods, satisfactory results are achieved in the simulation and in real data experiments. (C) 2003 society of Photo-Optical Instrumentation Engineers.
KeywordPlanar Pattern Automatic Calibration Plane At Infinity Absolute Point Vanishing Point
WOS HeadingsScience & Technology ; Physical Sciences
Indexed BySCI
Language英语
WOS Research AreaOptics
WOS SubjectOptics
WOS IDWOS:000183373500004
Citation statistics
Document Type期刊论文
Identifierhttp://ir.ia.ac.cn/handle/173211/9871
Collection09年以前成果
Affiliation1.City Univ Hong Kong, Dept Mfg Engn & Engn Management, Kowloon, Peoples R China
2.Chinese Acad Sci, Natl Lab Pattern Recognit, Inst Automat, Beijing, Peoples R China
Recommended Citation
GB/T 7714
Zhang, BW,Li, YF,Wu, FC. Planar pattern for automatic camera calibration[J]. OPTICAL ENGINEERING,2003,42(6):1542-1549.
APA Zhang, BW,Li, YF,&Wu, FC.(2003).Planar pattern for automatic camera calibration.OPTICAL ENGINEERING,42(6),1542-1549.
MLA Zhang, BW,et al."Planar pattern for automatic camera calibration".OPTICAL ENGINEERING 42.6(2003):1542-1549.
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