A Fast Surface Defect Detection Method Based on Background Reconstruction
Lv, Chengkan1,2; Zhang, Zhengtao1,2,3; Shen, Fei1,2,3; Zhang, Feng1,2,3; Su, Hu1,2,3
发表期刊INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING
ISSN2234-7593
2019-11-09
卷号21期号:3页码:363-375
摘要

In this paper, we propose an unsupervised background reconstruction method to detect defects on surfaces with unevenly distributed textures. An improved deep convolutional autoencoder is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, a weighted loss function based on structural similarity (SSIM) is utilized to adapt to the unevenly distributed texture background and improve the reconstruction accuracy. Furthermore, combined with the reconstructed defect-free reference, a novel difference analysis method based on the discrete cosine transform (DCT) is given to accurately segment the defect regions from the original image. A series of experiments for the defect detection on mobile phone cover glass (MPCG) are conducted. The processing time for an image of 512 x 512 pixels is only 20 ms, which satisfies the requirement of online detection. The experimental results verify the effectiveness of the proposed method.

关键词Defect detection Unsupervised learning Background reconstruction
DOI10.1007/s12541-019-00262-2
关键词[WOS]INSPECTION ; DEEP
收录类别SCI
语种英语
资助项目Youth Innovation Promotion Association, CAS[2013097] ; National Natural Science Foundation of China[61503378] ; National Natural Science Foundation of China[61503378] ; Youth Innovation Promotion Association, CAS[2013097]
WOS研究方向Engineering
WOS类目Engineering, Manufacturing ; Engineering, Mechanical
WOS记录号WOS:000495300100001
出版者KOREAN SOC PRECISION ENG
七大方向——子方向分类目标检测、跟踪与识别
引用统计
被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/28885
专题中科院工业视觉智能装备工程实验室_精密感知与控制
通讯作者Shen, Fei
作者单位1.Chinese Acad Sci, Inst Automat, Res Ctr Precis Sensing & Control, Beijing 100190, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
3.CASI Vis Technol CO LTD, Luoyang 471000, Henan, Peoples R China
第一作者单位精密感知与控制研究中心
通讯作者单位精密感知与控制研究中心
推荐引用方式
GB/T 7714
Lv, Chengkan,Zhang, Zhengtao,Shen, Fei,et al. A Fast Surface Defect Detection Method Based on Background Reconstruction[J]. INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,2019,21(3):363-375.
APA Lv, Chengkan,Zhang, Zhengtao,Shen, Fei,Zhang, Feng,&Su, Hu.(2019).A Fast Surface Defect Detection Method Based on Background Reconstruction.INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,21(3),363-375.
MLA Lv, Chengkan,et al."A Fast Surface Defect Detection Method Based on Background Reconstruction".INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING 21.3(2019):363-375.
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