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A dynamic RFID performance test system
Zhu, Zhiyuan; Tan, Jie; Zhao, Hongsheng; Guan, Qiang; Li, Na
2010
Conference Name2010 IEEE International Conference on RFID-Technology and Applications, RFID-TA 2010
Source PublicationIEEE International Conference on RFID-Technology and Applications (RFID-TA)
Pages31-36
Conference Date2010
Indexed ByEI
Document Type会议论文
Identifierhttp://ir.ia.ac.cn/handle/173211/5501
Collection综合信息系统研究中心
Recommended Citation
GB/T 7714
Zhu, Zhiyuan,Tan, Jie,Zhao, Hongsheng,et al. A dynamic RFID performance test system[C],2010:31-36.
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