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Expected affine: A registration method for damaged section in serial sections electron microscopy 期刊论文
FRONTIERS IN NEUROINFORMATICS, 2022, 卷号: 16, 页码: 11
作者:  Xin, Tong;  Shen, Lijun;  Li, Linlin;  Chen, Xi;  Han, Hua
收藏  |  浏览/下载:205/0  |  提交时间:2022/11/14
image registration  SSEM  broken sections  section fold  section crack  
Denoising of scanning electron microscope images for biological ultrastructure enhancement 期刊论文
JOURNAL OF BIOINFORMATICS AND COMPUTATIONAL BIOLOGY, 2022, 卷号: 20, 期号: 03, 页码: 21
作者:  Chang, Sheng;  Shen, Lijun;  Li, Linlin;  Chen, Xi;  Han, Hua
Adobe PDF(4726Kb)  |  收藏  |  浏览/下载:278/37  |  提交时间:2022/09/19
SEM  noise model  denoising  variance stabilization transformation  two-stage multi-loss  deep learning