Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs

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	Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs
	Zheng, Meisong; Wang, Zilong; Tu, Ji; Wang, Junye; Li, Lijian
发表期刊	Applied Mechanics and Materials
	2014-11
期号	713-715 页码:1127-1131
摘要	This paper presents an improved approach to Triple Modular Redundancy (TMR) which concerns don’ t care bits of LUT configuration bits and hence classifies the set of LUTs into SEU-sensitive and SEU-insensitive. Unlike the full TMR approach, the improved approach only triplicates SEU-sensitive LUTs and can greatly reduces the area overhead while maintaining the circuit reliability. The proposed approach is thoroughly tested on the MCNC’91 benchmarks. Compare with the full TMR method the proposed scheme can reduce the area overhead by 26.6% on average, at the same time the circuit reliability only reduced by 9.1 %. The improved approach can also increase mean time between failures (MTBF) by an average of six times more than the original circuit.
关键词	Fpga Tmr Windowing Seu
文献类型	期刊论文
条目标识符	http://ir.ia.ac.cn/handle/173211/11751
专题	空天信息研究中心
通讯作者	Li, Lijian
作者单位	中国科学院自动化研究所
第一作者单位	中国科学院自动化研究所
通讯作者单位	中国科学院自动化研究所
推荐引用方式 GB/T 7714	Zheng, Meisong,Wang, Zilong,Tu, Ji,et al. Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs[J]. Applied Mechanics and Materials,2014(713-715):1127-1131.
APA	Zheng, Meisong,Wang, Zilong,Tu, Ji,Wang, Junye,&Li, Lijian.(2014).Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs.Applied Mechanics and Materials(713-715),1127-1131.
MLA	Zheng, Meisong,et al."Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs".Applied Mechanics and Materials .713-715(2014):1127-1131.

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