The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method
Yuan LX(袁伦喜); Zhang ZT(张正涛); Tao X(陶显)
2016-12
会议名称World Congress on Intelligent Control and Automation
会议日期2016.05.12-2016.05.15
会议地点中国桂林
摘要

Surface defects detection techniques are widely used and play very important roles in many fields, such as precision optical element used in high energy laser, wafer used in semiconductor, cover glass used in mobile phone, etc. This paper introduced the research progress in surface defect detection based on vision measurement, analyzed the significant and application of detecting the surface defect by using vision measurement, summarized the main work of this technology, and analyzed the key points and challenges in the application of these techniques. At last, this paper outlines the prospect and the direction for the surface defect detection based on vision measurement.

关键词Defect Detect Vision Measurement
收录类别EI
语种英语
文献类型会议论文
条目标识符http://ir.ia.ac.cn/handle/173211/14558
专题精密感知与控制研究中心_精密感知与控制
作者单位中国科学院自动化研究所
推荐引用方式
GB/T 7714
Yuan LX,Zhang ZT,Tao X. The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method[C],2016.
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