Path Delay Test generation Toward Activation of worst Case Coupling Effects

	Path Delay Test generation Toward Activation of worst Case Coupling Effects
	minjin, zhang1 ; Huawei, Li 2; Xiaowei,Li 2
发表期刊	IEEE Transactions on Very Large Scale Integration (VLSI) Systems
	2011-11
卷号	19 期号:11 页码:1969-1982
摘要	; As the feature size scales down, crosstalk noise on circuit timing becomes increasingly significant. In this paper, we propose a path delay test generation method toward activation of worst case crosstalk effects, in order to decrease the test escape of delay testing. The proposed method performs transition- map-based timing analysis to identify crosstalk-sensitive critical paths, followed by a deterministic test generation process. Using the transition map instead of the timing window to manage the timing information, the proposed method can identify many false coupling sites and thus reduce the pessimism in crosstalk-induced fault collection caused by inaccurate timing analysis. It can also efficiently calculate the accumulative crosstalk-induced delay, and find the sub-paths which cause worst case crosstalk effects during test generation. By converting the timing constraints of coupling lines into logic constraints, complex timing processing for crosstalk effect activation is avoided during test generation. In addition, the tradeoff between accuracy and efficiency can be explored by varying the size of timescale used in the transition map.
关键词	Crosstalk-induced Delay Delay Testing Path Delay Fault Signal Integrity Test Generation Timing Analysis
WOS记录号	WOS:000294869500004
引用统计	被引频次：7[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.ia.ac.cn/handle/173211/15398
专题	国家专用集成电路设计工程技术研究中心
作者单位	1.Institute of Automation, Chinese Academy of Sciences 2.Institute of Computing Technology, Chinese Academy of Sciences
推荐引用方式 GB/T 7714	minjin, zhang,Huawei, Li,Xiaowei,Li. Path Delay Test generation Toward Activation of worst Case Coupling Effects[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2011,19(11):1969-1982.
APA	minjin, zhang,Huawei, Li,&Xiaowei,Li.(2011).Path Delay Test generation Toward Activation of worst Case Coupling Effects.IEEE Transactions on Very Large Scale Integration (VLSI) Systems,19(11),1969-1982.
MLA	minjin, zhang,et al."Path Delay Test generation Toward Activation of worst Case Coupling Effects".IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19.11(2011):1969-1982.

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