Motion control for cylindrical objects in microscopes’ view using a projection method: I. collision detection and detach control

CASIA OpenIR > 多模态人工智能系统全国重点实验室 > 人工智能与机器学习（杨雪冰）-技术团队

	Motion control for cylindrical objects in microscopes’ view using a projection method: I. collision detection and detach control
	dengpeng xing; Fangfang Liu; Song Liu; De Xu
发表期刊	IEEE Transactions on Industrial Electronics
	2017-07
卷号	64 期号:7 页码:5524-5533
其他摘要	This paper investigates collision detection between cylindrical or cylinder-enveloped components when mutual blocking occurs in the view of microscopes and detach control to separate objects if contact occurs. We use a projectionmethod to convert two microscopic views to contours on a projection plane and to detect high-dimensional collision by studying the projection’s relationships in low dimension. Eleven cases are totally categorized and 12 parameters are constructed for detection on the basis of relative postures and positions. Furthermore, we present a detach controller to handle with object contact according to collision status, objects’ main axis, and the computed contact position. Simulations and experiments are carried out to demonstrate the validity of the proposed method.
关键词	Collision Detection
文献类型	期刊论文
条目标识符	http://ir.ia.ac.cn/handle/173211/20357
专题	多模态人工智能系统全国重点实验室_人工智能与机器学习（杨雪冰）-技术团队
推荐引用方式 GB/T 7714	dengpeng xing,Fangfang Liu,Song Liu,等. Motion control for cylindrical objects in microscopes’ view using a projection method: I. collision detection and detach control[J]. IEEE Transactions on Industrial Electronics,2017,64(7):5524-5533.
APA	dengpeng xing,Fangfang Liu,Song Liu,&De Xu.(2017).Motion control for cylindrical objects in microscopes’ view using a projection method: I. collision detection and detach control.IEEE Transactions on Industrial Electronics,64(7),5524-5533.
MLA	dengpeng xing,et al."Motion control for cylindrical objects in microscopes’ view using a projection method: I. collision detection and detach control".IEEE Transactions on Industrial Electronics 64.7(2017):5524-5533.

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