A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD

doi:10.1109/LSP.2021.3080196

	A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD
	Zhu, Mingzhu 1,2; Yu, Junzhi3 ; Gao, Zhang4 ; He, Bingwei 1; Liu, Jiantao 1
发表期刊	IEEE SIGNAL PROCESSING LETTERS
ISSN	1070-9908
	2021
卷号	28 页码:1065-1069
通讯作者	Yu, Junzhi(junzhi.yu@ia.ac.cn)
摘要	In this paper, we propose a novel edge consistency metric for multi-modal correspondence. It is based on a novel observation on image truncated SVD (singular value decomposition) termed regression robustness, which describes the fact that, a good approximation from image truncated SVD can be inherited even if the eigen-images change due to expansion and channel-dependent offsets. Compared to state-of-the-arts, multi-modal edge consistency metric can simultaneously handle multiple images with complex modality changes, including local variation, gradient reverse, intensity order change, and texture loss. Its complexity is almost linear to pixel number. Remarkable accuracies have been achieved in experiments.
关键词	Image edge detection Measurement Robustness Linear regression Complexity theory Noise measurement Mutual information Regression robustness multi-modal corres-pondence edge consistency singular value decomposition
DOI	10.1109/LSP.2021.3080196
关键词[WOS]	IMAGE REGISTRATION ; MUTUAL-INFORMATION
收录类别	SCI
语种	英语
资助项目	National Key Research and Development Program of China[2020YFB1312800] ; Opening Project of Guangdong Provincial Key Lab of Robotics and Intelligent System
项目资助者	National Key Research and Development Program of China ; Opening Project of Guangdong Provincial Key Lab of Robotics and Intelligent System
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000659546200003
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计
文献类型	期刊论文
条目标识符	http://ir.ia.ac.cn/handle/173211/45308
专题	复杂系统管理与控制国家重点实验室
通讯作者	Yu, Junzhi
作者单位	1.Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China 2.Chinese Acad Sci, Shenzhen Inst Adv Technol, Guangdong Prov Key Lab Robot & Intelligent Syst, Shenzhen 518055, Peoples R China 3.Peking Univ, State Key Lab Turbulence & Complex Syst, Dept Adv Mfg & Robot, BIC ESAT,Coll Engn, Beijing 100871, Peoples R China 4.Chinese Acad Sci, Inst Automat, State Key Lab Management & Control Complex Syst, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Zhu, Mingzhu,Yu, Junzhi,Gao, Zhang,et al. A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD[J]. IEEE SIGNAL PROCESSING LETTERS,2021,28:1065-1069.
APA	Zhu, Mingzhu,Yu, Junzhi,Gao, Zhang,He, Bingwei,&Liu, Jiantao.(2021).A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD.IEEE SIGNAL PROCESSING LETTERS,28,1065-1069.
MLA	Zhu, Mingzhu,et al."A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD".IEEE SIGNAL PROCESSING LETTERS 28(2021):1065-1069.