Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM
Fu, Xiang1; Yang, Yuting1; Sun, Zhenhuan1; Su, Hu2; Li, Youfu3; Li, Teng1; Liu, Song4,5
发表期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN0018-9456
2023
卷号72页码:12
通讯作者Li, Teng(liteng1@shanghaitech.edu.cn) ; Liu, Song(liusong@shanghaitech.edu.cn)
摘要The article investigates the problem of visual tracking of moving objects in nanomanipulation inside a scanning electron microscope (SEM). Image noise is a primary concern when dealing with the problem, which includes the inherent statistical noise and that induced by the motion distortion. A visual tracking method with SEM image denoising algorithm is proposed. The denoising algorithm is well incorporated with robot motion by innovatively leveraging the image Jacobian matrix technique. The denoising algorithm removes image noise and provides a more realistic image. On this basis, template matching is utilized to achieve visual tracking on the image plane. Experimental results show that the visual tracking performance on the image plane was well improved by 31.4% for the point feature, 60.6% for the line feature, and 52.1% for the area feature in terms of root mean square error (RMSE) compared to that without motion distortion removal. Comparison experiments validate the state-of-the-art performance achieved by the proposed method and thus the superiority.
关键词Dynamic visual tracking motion distortion removal nanomanipulation scanning electron microscope (SEM) image denoising
DOI10.1109/TIM.2023.3318726
关键词[WOS]MANIPULATION ; NOISE
收录类别SCI
语种英语
资助项目Shanghai Pujiang Talents Program[21PJ1410500]
项目资助者Shanghai Pujiang Talents Program
WOS研究方向Engineering ; Instruments & Instrumentation
WOS类目Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS记录号WOS:001085217500017
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/54338
专题多模态人工智能系统全国重点实验室
中科院工业视觉智能装备工程实验室_精密感知与控制
通讯作者Li, Teng; Liu, Song
作者单位1.ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China
2.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
3.City Univ Hong Kong, Dept Mech & Biomed Engn, Hong Kong, Peoples R China
4.ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China
5.Shanghai Engn Res Ctr Intelligent Vis & Imaging, Shanghai 201210, Peoples R China
推荐引用方式
GB/T 7714
Fu, Xiang,Yang, Yuting,Sun, Zhenhuan,et al. Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2023,72:12.
APA Fu, Xiang.,Yang, Yuting.,Sun, Zhenhuan.,Su, Hu.,Li, Youfu.,...&Liu, Song.(2023).Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,72,12.
MLA Fu, Xiang,et al."Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 72(2023):12.
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