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Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 12
作者:  Fu, Xiang;  Yang, Yuting;  Sun, Zhenhuan;  Su, Hu;  Li, Youfu;  Li, Teng;  Liu, Song
收藏  |  浏览/下载:108/0  |  提交时间:2023/12/21
Dynamic visual tracking  motion distortion removal  nanomanipulation  scanning electron microscope (SEM) image denoising  
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载:283/7  |  提交时间:2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载:274/63  |  提交时间:2022/03/03
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