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Weak scratch detection and defect classification methods for a large-aperture optical element
Tao, Xian; Xu, De; Zhang, Zheng-Tao; Zhang, Feng; Liu, Xi-Long; Zhang, Da-Peng
Source PublicationOPTICS COMMUNICATIONS
2017-03-15
Volume387Issue:0Pages:390-400
SubtypeArticle
AbstractSurface defects on optics cause optic failure and heavy loss to the optical system. Therefore, surface defects on optics must be carefully inspected. This paper proposes a coarse-to-fine detection strategy of weak scratches in complicated dark-field images. First, all possible scratches are detected based on bionic vision. Then, each possible scratch is precisely positioned and connected to a complete scratch by the LSD and a priori knowledge. Finally, multiple scratches with various types can be detected in dark-field images. To classify defects and pollutants, a classification method based on GIST features is proposed. This paper uses many real dark-field images as experimental images. The results show that this method can detect multiple types of weak scratches in complex images and that the defects can be correctly distinguished with interference. This method satisfies the real-time and accurate detection requirements of surface defects.
KeywordOptical Inspection Weak Scratches Surface Defects Classification Large-aperture Optical Element
WOS HeadingsScience & Technology ; Physical Sciences
DOI10.1016/j.optcom.2016.10.062
WOS KeywordLARGE FINE OPTICS ; SURFACE ; SYSTEM
Indexed BySCI
Language英语
Funding OrganizationNational Natural Science Foundation of China(61227804 ; 61303177 ; 61473293 ; 61673383)
WOS Research AreaOptics
WOS SubjectOptics
WOS IDWOS:000390597300060
Citation statistics
Document Type期刊论文
Identifierhttp://ir.ia.ac.cn/handle/173211/13380
Collection精密感知与控制研究中心_精密感知与控制
AffiliationChinese Acad Sci, Inst Automat, Res Ctr Precis Sensing & Control, Beijing, Peoples R China
First Author AffilicationChinese Acad Sci, Inst Automat, Res Ctr Precis Sensing & Control, Beijing 100190, Peoples R China
Recommended Citation
GB/T 7714
Tao, Xian,Xu, De,Zhang, Zheng-Tao,et al. Weak scratch detection and defect classification methods for a large-aperture optical element[J]. OPTICS COMMUNICATIONS,2017,387(0):390-400.
APA Tao, Xian,Xu, De,Zhang, Zheng-Tao,Zhang, Feng,Liu, Xi-Long,&Zhang, Da-Peng.(2017).Weak scratch detection and defect classification methods for a large-aperture optical element.OPTICS COMMUNICATIONS,387(0),390-400.
MLA Tao, Xian,et al."Weak scratch detection and defect classification methods for a large-aperture optical element".OPTICS COMMUNICATIONS 387.0(2017):390-400.
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