Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction
Gong, Xinyi1,2; Su, Hu1,2; Xu, De1,2; Zhang, Jiabin1,2; Zhang, Lei1,2; Zhang, Zhengtao1,2
发表期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN0018-9456
2020-06-01
卷号69期号:6页码:3262-3274
摘要

This paper investigates automatic quality inspection for the components with a small diameter and deep aperture. An automatic pick-and-place system is constructed, which employs an endoscope to achieve better image quality aiming at the characteristics of the component. A coarse-to-fine contour extraction algorithm with four steps is presented to inspect the component's quality. First, approximate locations of the targets are estimated using faster region-based convolutional neural networks (faster RCNN). Second, the corresponding edge image is obtained by using the multiscale probability boundary (mPb) detector. Third, edge enhancement is performed, which is based on the Brownian motion model. Fourth, the corresponding contours are finely extracted by edge grouping. A shape analyzing algorithm is utilized to classify the components based on the extracted contours. Comparison experiments fully demonstrate the superiority of the proposed inspection method over existing methods. Meanwhile, successful inspection results on challenging real-world image data prove that the system is of practical significance to industrial applications.

关键词Coarse-fine positioning deep-hole component defect inspection edge grouping image processing
DOI10.1109/TIM.2019.2928347
关键词[WOS]COMPLETION ; BOUNDARIES ; MODEL ; SHAPE
收录类别SCI
语种英语
资助项目National Key Research and Development Program of China[2017YFB1302303] ; National Natural Science Foundation of China[61503378] ; National Natural Science Foundation of China[61733004]
项目资助者National Key Research and Development Program of China ; National Natural Science Foundation of China
WOS研究方向Engineering ; Instruments & Instrumentation
WOS类目Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS记录号WOS:000546622100062
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
七大方向——子方向分类目标检测、跟踪与识别
引用统计
被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/40017
专题中科院工业视觉智能装备工程实验室_精密感知与控制
通讯作者Zhang, Zhengtao
作者单位1.Chinese Acad Sci CASIA, Inst Automat, Res Ctr Precis Sensing & Control, Beijing 100190, Peoples R China
2.Univ Chinese Acad Sci, Beijing 101408, Peoples R China
第一作者单位中国科学院自动化研究所
通讯作者单位中国科学院自动化研究所
推荐引用方式
GB/T 7714
Gong, Xinyi,Su, Hu,Xu, De,et al. Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2020,69(6):3262-3274.
APA Gong, Xinyi,Su, Hu,Xu, De,Zhang, Jiabin,Zhang, Lei,&Zhang, Zhengtao.(2020).Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,69(6),3262-3274.
MLA Gong, Xinyi,et al."Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 69.6(2020):3262-3274.
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