A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction
Lv, Chengkan1,2; Shen, Fei1,2,3; Zhang, Zhengtao1,2,3; Xu, De1,2; He, Yonghao1,2,3
发表期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN0018-9456
2021
卷号70页码:13
摘要

In this article, an anomaly detection method based on background reconstruction is proposed to perform defect inspection on the texture surface of the industrial products. This method consists of two modules: 1) an autoencoder integrated with a generative adversarial network is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, extra anomalous images are introduced and a mapping method of anomaly is given to improve the stability of reconstruction. 2) A U-net based inspection network is trained to perform pixel-wise analysis of the differences between the original and the reconstructed defect-free image. During these processes, only artificial synthesized defective images are utilized to train the model without any real defective samples. A series of experiments are conducted on several texture image data sets and the industrial production line. The experimental results reveal the effectiveness and versatility of the proposed method.

关键词Anomaly detection autoencoder background reconstruction defect inspection
DOI10.1109/TIM.2020.3038413
关键词[WOS]ANOMALY DETECTION
收录类别SCI
所属项目编号2020139
语种英语
资助项目Youth Innovation Promotion Association, CAS[2020139]
项目资助者Youth Innovation Promotion Association, CAS
WOS研究方向Engineering ; Instruments & Instrumentation
WOS类目Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS记录号WOS:000691803600035
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
七大方向——子方向分类目标检测、跟踪与识别
引用统计
被引频次:19[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ia.ac.cn/handle/173211/45936
专题中科院工业视觉智能装备工程实验室_精密感知与控制
通讯作者Zhang, Zhengtao
作者单位1.Institute of Automation, Chinese Academy of Sciences, Beijing 100190, People’s Republic of China
2.School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing 100049, People’s Republic of China
3.CASI Vision Technology, Company, Ltd., Luoyang 471000, People’s Republic of China
第一作者单位中国科学院自动化研究所
通讯作者单位中国科学院自动化研究所
推荐引用方式
GB/T 7714
Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,et al. A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2021,70:13.
APA Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,Xu, De,&He, Yonghao.(2021).A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,70,13.
MLA Lv, Chengkan,et al."A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 70(2021):13.
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