Knowledge Commons of Institute of Automation,CAS
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction | |
Lv, Chengkan1,2; Shen, Fei1,2,3; Zhang, Zhengtao1,2,3; Xu, De1,2; He, Yonghao1,2,3 | |
发表期刊 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT |
ISSN | 0018-9456 |
2021 | |
卷号 | 70页码:13 |
摘要 | In this article, an anomaly detection method based on background reconstruction is proposed to perform defect inspection on the texture surface of the industrial products. This method consists of two modules: 1) an autoencoder integrated with a generative adversarial network is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, extra anomalous images are introduced and a mapping method of anomaly is given to improve the stability of reconstruction. 2) A U-net based inspection network is trained to perform pixel-wise analysis of the differences between the original and the reconstructed defect-free image. During these processes, only artificial synthesized defective images are utilized to train the model without any real defective samples. A series of experiments are conducted on several texture image data sets and the industrial production line. The experimental results reveal the effectiveness and versatility of the proposed method. |
关键词 | Anomaly detection autoencoder background reconstruction defect inspection |
DOI | 10.1109/TIM.2020.3038413 |
关键词[WOS] | ANOMALY DETECTION |
收录类别 | SCI |
所属项目编号 | 2020139 |
语种 | 英语 |
资助项目 | Youth Innovation Promotion Association, CAS[2020139] |
项目资助者 | Youth Innovation Promotion Association, CAS |
WOS研究方向 | Engineering ; Instruments & Instrumentation |
WOS类目 | Engineering, Electrical & Electronic ; Instruments & Instrumentation |
WOS记录号 | WOS:000691803600035 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
七大方向——子方向分类 | 目标检测、跟踪与识别 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ia.ac.cn/handle/173211/45936 |
专题 | 中科院工业视觉智能装备工程实验室_精密感知与控制 |
通讯作者 | Zhang, Zhengtao |
作者单位 | 1.Institute of Automation, Chinese Academy of Sciences, Beijing 100190, People’s Republic of China 2.School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing 100049, People’s Republic of China 3.CASI Vision Technology, Company, Ltd., Luoyang 471000, People’s Republic of China |
第一作者单位 | 中国科学院自动化研究所 |
通讯作者单位 | 中国科学院自动化研究所 |
推荐引用方式 GB/T 7714 | Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,et al. A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2021,70:13. |
APA | Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,Xu, De,&He, Yonghao.(2021).A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,70,13. |
MLA | Lv, Chengkan,et al."A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 70(2021):13. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
A_Novel_Pixel-Wise_D(4910KB) | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | 浏览 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论